AISI 301 / UNS S30100 - Certified reference material for XRF, OES, combustion analysis, and laboratory elemental testing.

Certified Chemical Composition - (AISI 301 / UNS S30100 – wt%)

Values enclosed in parentheses ( ) are provided for reference purposes only. These values are not certified and should not be used for calibration where certified values are required. 

Analytical Applications

XRF Analysis (Benchtop & Handheld)

This CRM is commonly used for:

• Calibration and verification of XRF analyzers
• Stainless steel alloy identification and grade confirmation
• Drift monitoring and operator training

It provides stable reference values for chromium, nickel, manganese, and other elements measured by XRF. As with all XRF techniques, carbon is not directly measured.

Optical Emission Spectroscopy (OES)

For spark-OES systems, the solid disc format is suitable for:

• Stainless steel calibration and verification
• Grade differentiation and routine QA checks
• Laboratory and production-floor analysis

Chip-Based Laboratory Methods

Chips produced from the same certified material are suitable for:

• Combustion analysis of carbon, sulfur, and nitrogen
• ICP-OES / ICP-MS following acid digestion
• Classical wet chemistry and method cross-checks

Chips represent the certified bulk composition and are intended for laboratory use.

Material Consistency and Use

• Produced from a single heat for compositional consistency
• Certified values reflect the average bulk chemistry
• Suitable for long-term calibration and verification when handled properly

What’s Included

• 301 Stainless Steel Certified Reference Material
• Certificate of Analysis with certified values and uncertainty
• Disc and chip configurations available

Frequently Asked Questions

What is a 301 stainless steel CRM used for?
It is used to calibrate and verify XRF, OES, and laboratory instruments that measure stainless steel chemistry.

Can this be used with handheld XRF?
Yes. It is suitable for handheld and benchtop XRF alloy verification and training.

Can this CRM be used for carbon analysis?
Carbon is not measured by XRF, but chip samples may be used for combustion-based carbon analysis.

Is this suitable for ICP or wet chemistry?
Yes. Chips can be digested and used for ICP-OES, ICP-MS, and classical laboratory methods.

Available Sizes and Formats

XRF Disc: 38 mm diameter × 3 mm thickness
Suitable for benchtop XRF and handheld XRF analysis.

OES Disc: 38 mm diameter × 19 mm thickness
Suitable for benchtop OES analysis.

Chip Sample: 100 g of stainless steel chips
Intended for combustion analysis (C, S, N), ICP-OES, ICP-MS, and classical wet chemistry following digestion.

All formats are produced from the same certified bulk material and represent the certified average composition.